IEEE Biometrics Council is happy to introduce the new Editor-in-Chief of the IEEE Transactions of Biometrics and Identity Science. The new Editor-in-Chief is Professor Nalini Ratha and his term will be from July 2021 to June 2024.
Prof. Ratha is an Empire Innovation Professor with the Department of Computer Science and Engineering, University at Buffalo – SUNY. Previously, he was a Research Staff Member at the IBM Thomas J. Watson Research Center, Yorktown Heights, New York. He is one of the distinguished researchers in biometrics and recipient of the IEEE Biometrics Council Leadership Award in 2019.
He has co-authored a popular textbook entitled “A guide to Biometrics Selection and System design” and co-edited four books entitled “Deep Learning-Based Face Analytics”, “Domain Adaptation in Visual Understanding”, “Advances in Biometrics: Sensors, Algorithms and Systems” and “Automatic Fingerprint Recognition Systems” published by Springer. More recently, he was the general co-chair of BTAS 2016 and ISAB 2017 and 2018, and program co-chair of IJCB 2020. Over the last couple of years, he has co-organized several workshops and CVPR/ECCV/ICCV/AAAI on meta learning, bias, blockchain and disguised faces in the wild. In the past, he served on the editorial board of Pattern Recognition journal, IEEE Trans. on Pattern Analysis and Machine Intelligence, IEEE Trans. on Image Processing, and IEEE Trans. on Systems, Man and Cybernetics. He is a guest co-editor of a special issue on biometrics for IEEE Trans. on SMC-B and also for IEEE Trans. on Information Forensics and Security. He has received several patent awards and a “Research Division” award and an “Outstanding Technical Innovation Award” at IBM and named a “Master Inventor” at IBM Research in 2018. He served as the President of the IEEE Biometrics Council from Jan 2011-Dec 2012 and currently serves as the Fellow Committee chair and member of the nominations committe for the IEEE Biometrics Council. He has served on advisory boards of EU-INGRESS and EU-Fidelity and served on several NSF evaluation panels.
We are delighted to have you among us. On behalf of the Biometrics Council, we would like to extend our warmest welcome and good wishes!